A seminary sponsorized by the Biometrics Council Chapter will take place at the Roma Tre University (Via Vito Volterra 62), on 16 October 2018 (10.00-11.00) and on 19 October 2018 (10.00-11.00). The first meeting is titled “Likelihood-ratio classifiers in biometrics” and here you can find more information about the event and the participation of the Professor Dr.Ir. R.N.J. Veldhuis (Raymond) from the University of Twente (The Netherlands). The second meeting, instead, is titled “Examples of the application of biometrics in forensics” and here you can find all the information about the event.
IEEE Italy Section Biometrics Council Chapter – Seminary